06 October 2023
Science Building
America/Chicago timezone
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Use of deep-learning-based object detection technique in quality control of silicon particle detectors
We present the application of deep-learning-based computer vision techniques for quality control (QC) of silicon-based particle detectors construction, focusing on wire bonds and sensor surfaces, characterizing the features into classes such as 'no wires,' 'glue,' 'broken wires,' and more. Manual QC of printed circuit boards, electronics components, and silicon sensor surfaces are generally costly, labor-intensive, and error-prone. The use of You Only See Once (YOLOV5) object detection for QC purposes is not only an effective tool for the current Compact Muon Solenoid Endcap Calorimeter Upgrade project at the Advanced Particle Detector Laboratory, but also for the future applications to other detector construction projects, promising increased efficiency and precision.
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Id: 2
Place: Science Building
Texas Tech University, Physics & Astronomy 

Room: 106
Starting date:
06-Oct-2023   13:00 (America/Chicago)
Duration: 03h00'
Contribution type: Poster
Primary Authors: Mr. GUPTA, Abhinav Raj (High Energy Group at Texas Tech University)
Co-Authors: SCHNEIDER, Odin (Texas Tech University)
Mr. MORENO, Cristobal (Physics Undergraduate)
Presenters: Mr. GUPTA, Abhinav Raj
Material: slide Slides
poster Poster